Method and system for evaluating computer program tests by...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

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07574681

ABSTRACT:
Methods and systems for evaluating computer program tests by mutation analysis, including the execution of mutated programs with the insertion of mutations and the identification of mutated programs which, with a pre-determined test, provide a result identical to a pre-determined result. A series of relevant tests is selected for each mutation from a plurality of tests. A mutation ranking system can be determined with the application of at least a first simplicity criterion to the selected series of tests. The mutated programs are subsequently executed according to the mutation ranking order. Each mutated program is executed with the tests from the associated series of tests. In addition, the method can comprise the programming and activation of a programmable circuit. A ranking system for the tests from a series of tests can be determined with the application of a second simplicity criterion to the tests from said series of tests.

REFERENCES:
patent: 6298317 (2001-10-01), Wiemann
patent: 6810372 (2004-10-01), Unnikrishnan et al.
patent: 7039545 (2006-05-01), Bundy et al.
patent: 199 59 157 (2000-08-01), None
patent: A 2001-2385523 (2001-08-01), None
B. Baudry et al., “Genes and Bacteria for Automatic Test Cases Optimization in the .NET Environment,” Proceeding of the 13thInternational Symposium on Software Reliability Engineering (ISSRE '02), Nov. 12, 2002, pp. 195-206.

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