Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-05-26
2009-08-11
Nguyen, Dao H (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S388000, C257S412000
Reexamination Certificate
active
07573106
ABSTRACT:
A method of manufacturing a semiconductor device comprises forming a gate insulation film on a semiconductor substrate; forming a first gate electrode and a second gate electrode on the gate insulation film, the area of the second gate electrode on the surface of the semiconductor substrate being larger than that of the first gate electrode; selectively etching or grinding an upper part of the second gate electrode so that the thickness of the second gate electrode becomes smaller than the thickness of the first gate electrode; depositing a metal film on the first gate electrode and the second gate electrode; and siliciding the whole of the first gate electrode and the whole of the second gate electrode.
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Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
Nguyen Dao H
Nguyen Tram H
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