Semiconductor memory device with reset during a test mode

Details Semiconductor memory device with reset during a test mode Semiconductor memory device with reset during a test mode

2007-06-29

2009-11-17

Nguyen, VanThu (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050, C365S191000, C365S233130, C327S142000

Reexamination Certificate

active

07619937

ABSTRACT:
A semiconductor memory device performs a reset operation at a wafer state by using a signal input through an address pin in a test mode. The semiconductor memory device includes a buffer for transferring a reset command in response to a reset-active signal and a test reset signal, a test-reset entry signal generation unit for generating an internal test-reset entry signal in response to the test reset signal, and a rest signal driving unit for driving an active signal of an output signal of the buffer and the internal test-reset entry signal as an internal reset signal for a reset mode entry.

REFERENCES:
patent: 5039875 (1991-08-01), Chang
patent: 5612923 (1997-03-01), Gibson et al.
patent: 5870342 (1999-02-01), Fukuda
patent: 6118709 (2000-09-01), Zink et al.
patent: 6690220 (2004-02-01), Kuboshima et al.
patent: 6914461 (2005-07-01), Kwon
patent: 7019417 (2006-03-01), Kang
patent: 7251171 (2007-07-01), Nishimura et al.
patent: 2004/0071139 (2004-04-01), Burnett
patent: 2005/0190627 (2005-09-01), Nakatake et al.
patent: 2007/0069786 (2007-03-01), Chung et al.
patent: 10-149679 (1998-06-01), None
patent: 2002-084176 (2002-03-01), None
patent: 2002-84176 (2002-03-01), None
patent: 2002-323938 (2002-08-01), None
patent: 10-0670697 (2007-01-01), None

Affiliated with

Also associated with

Rating

Semiconductor memory device with reset during a test mode does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device with reset during a test mode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device with reset during a test mode will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4071512