Method for patterning Mo layer in a photovoltaic device...

Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal

Reexamination Certificate

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C438S084000, C438S102000

Reexamination Certificate

active

07547569

ABSTRACT:
A processing method described herein provides a method of patterning a MoSe2and/or Mo material, for example a layer of such material(s) in a thin-film structure. According to one aspect, the invention relates to etch solutions that can effectively etch through Mo and/or MoSe2. According to another aspect, the invention relates to etching such materials when such materials are processed with other materials in a thin film photovoltaic device. According to other aspects, the invention includes a process of etching Mo and/or MoSe2with selectivity to a layer of CIGS material in an overall process flow. According to still further aspects, the invention relates to Mo and/or MoSe2etch solutions that are useful in an overall photolithographic process for forming a photovoltaic cell and/or interconnects and test structures in a photovoltaic device.

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“Etch,” definition from Dictionary.com, Feb. 21, 2008.
Chandra and Sahu, “Electrodeposited semiconducting molybdenum selenide films: I. Preparatory technique and structural characterization,” J. Phys. D: App. Phys., 17:2115-2123 (1984).
Ohmori et al., “pH Dependent Controlled patterning of p-MoSe2 Surfaces by In-Situ Electrochemical Scanning Tunneling Microscopy,” Langmuir, 14 (21):6287-6290 (1998).

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