Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE51005, C257SE29130

Reexamination Certificate

active

07601996

ABSTRACT:
A semiconductor device comprises a field-effect transistor arranged in a semiconductor substrate, which transistor has a gate electrode, source/drain impurity diffusion regions, and carbon layers surrounding the source/drain impurity diffusion regions. Each of the carbon layers is provided at an associated of the source/drain impurity diffusion regions and positioned so as to be offset from the front edge of a source/drain extension in direction away from the gate electrode and to surround as profile the associated source/drain impurity diffusion region.

REFERENCES:
patent: 6153920 (2000-11-01), Gossmann et al.
patent: 7122435 (2006-10-01), Chidambaram et al.
patent: 2005/0095765 (2005-05-01), Saiki et al.
patent: 2006/0134872 (2006-06-01), Hattendorf et al.
patent: 2006/0216900 (2006-09-01), Wang et al.
patent: 2005-136351 (2005-05-01), None
2004 Symposium on VLSI Technology, Digest of Technical Papers, pp. 88-89, 2004.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and manufacturing method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4062872

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.