Method of manufacturing a semiconductor device

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device

Reexamination Certificate

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C430S313000, C430S394000, C430S323000, C430S324000, C430S316000

Reexamination Certificate

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07604926

ABSTRACT:
A method of manufacturing a semiconductor device, comprises forming a first mask pattern on an under-layer region, forming a plurality of dummy-line patterns on the under-layer region, the dummy-line patterns being arranged at a first pitch, forming second mask patterns having mask parts provided on long sides of the dummy-line patterns, removing the dummy-line patterns, and etching the under-layer region by using the first mask pattern and the mask parts as a mask.

REFERENCES:
patent: 5328810 (1994-07-01), Lowrey et al.
patent: 6063688 (2000-05-01), Doyle et al.
patent: 6475891 (2002-11-01), Moon
patent: 6475892 (2002-11-01), Bhakta
patent: 2004/0165443 (2004-08-01), Harari

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