Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate
2004-10-14
2009-10-13
Auduong, Gene N. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Bad bit
C365S225700
Reexamination Certificate
active
07602659
ABSTRACT:
A memory device sharing a fail-repairing part is disclosed. The memory device has a plurality of banks that share a fuse and control unit for repairing a row fail or column fail in memory cell arrays in the respective banks. The memory device has reduced size and improved repair efficiency.
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Auduong Gene N.
Hynix / Semiconductor Inc.
Ladas & Parry LLP
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