Electrically selectable redundant components for an embedded DRA

Details Electrically selectable redundant components for an embedded DRA Electrically selectable redundant components for an embedded DRA

1997-12-23

1999-05-25

Nelms, David

Static information storage and retrieval

Read/write circuit

Signals

36523003, 36523006, 365200, G11C 700

Patent

active

059075112

ABSTRACT:
A DRAM array embedded in an IC, ASIC or a SLIC includes a plurality of redundant functional elements and a substitution circuit which responds to signals communicated from a bus to electrically connect selected ones of the redundant elements as fully functional replacements for corresponding defective elements of the DRAM array. The redundant elements include bit blocks and word line groups. The substitution circuit includes a controllable selector which electrically connects selected ones of the bit blocks and word lines to respond to data and address signals communicated on the bus. A register responds to bus control signals and supplies signals to achieve connection of the redundant elements. The defective elements are identified, and the replacement redundant elements are substituted, by testing the elements of the DRAM array for proper functionality and processing the results of the test.

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