Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2004-11-24
2008-12-30
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07472365
ABSTRACT:
The present invention includes a method and an apparatus, in one embodiment, in the form of an integrated circuit and programmable fabric design tool, for calculating skew in a manner that does not include unnecessary skew values, resulting in a skew value without pessimism. A setup slack determination ensures that data launched or transmitted from a source register reaches the destination register within a specified maximum cycle time and is defined as the difference between a minimum (early) destination time and a maximum (late) source time without unnecessary skew values. A hold check slack determination ensures the data does not “race” from the source register to the destination register on the same clock edge and is calculated as a difference between a maximum (late) destination time and a minimum (early) source time without unnecessary skew values. A circuit's operational frequency and layout are based upon the method for calculating skew.
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Do Thuan
Liu Justin
Markison Timothy W.
Xilinx , Inc.
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