Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor
Reexamination Certificate
2006-10-12
2008-11-04
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
C438S122000, C257SE21494, C257SE21499, C257SE21503, C257SE21508, C257SE23101
Reexamination Certificate
active
07445957
ABSTRACT:
A wafer level semiconductor package with a build-up layer is provided, which includes a glass frame having a through hole for receiving a semiconductor chip therein, a low-modulus buffer material filled within the space formed between the semiconductor chip and the glass frame, a build-up layer formed on the glass frame and the semiconductor chip such that the build-up layer is electrically connected to the semiconductor chip, and a plurality of conductive elements mounted on the build-up layer so that the semiconductor chip is electrically connected to external devices. With the use of the glass frame and low-modulus buffer material, the wafer level semiconductor package thus-obtained is free from warpage, chip-crack, and delamination problems and the reliability thereof is enhanced. A method for fabricating the wafer level semiconductor package is also provided.
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Hsiao Cheng-Hsu
Huang Chien-Ping
Huang Chih-Ming
Corless Peter F.
Edwards Angell Palmer & & Dodge LLP
Jensen Steven M.
Nhu David
Siliconware Precision Industries Co. Ltd.
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