Static information storage and retrieval – Read/write circuit – Data refresh
Reexamination Certificate
2007-01-16
2008-12-16
Tran, Michael T (Department: 2827)
Static information storage and retrieval
Read/write circuit
Data refresh
C365S205000
Reexamination Certificate
active
07466617
ABSTRACT:
A dynamic random access memory circuit has at least one write bit line, at least one read bit line, a capacitive storage device, a write access device operatively coupled to the capacitive storage device and the at least one write bit line, a sense amplifier operatively coupled to the at least one read bit line and configured to generate an output signal, and a refresh bypass device operatively associated with the sense amplifier and the at least one write bit line so as to selectively pass the output signal to the at least one write bit line.
REFERENCES:
patent: 3387286 (1968-06-01), Dennard
patent: 5768186 (1998-06-01), Ma
patent: 6211548 (2001-04-01), Ma
patent: 6475874 (2002-11-01), Xiang et al.
patent: 6573134 (2003-06-01), Ma et al.
patent: 6614064 (2003-09-01), Besser et al.
patent: 6664589 (2003-12-01), Forbes et al.
patent: 6750066 (2004-06-01), Cheung et al.
patent: 6916698 (2005-07-01), Mocuta et al.
patent: 6924184 (2005-08-01), Cave et al.
patent: 7027326 (2006-04-01), Luk et al.
patent: 2001/0035548 (2001-11-01), Wahlstrom
patent: 2005/0128803 (2005-06-01), Luk et al.
patent: 2005/0145895 (2005-07-01), Luk et al.
Doris et al., “High Performance FDSOI CMOS Technology with Metal Gate and High-k,” 4-900784-00-1, Symp on VLSI Techn Digest of Technical Papers, pp. 214-215 (2005).
Hou et al., “Impact of Metal Gate Work Function on Nano CMOS Device Performance,” 0-7803-8511-X, IEEE, pp. 57-60 (2004).
Luk et al., “Dynamic Memory Cell Structures,” U.S. Appl. No. 11/408,752 (Apr. 21, 2006).
Park et al., “Novel Damage-free Direct Metal Gate Process Using Atomic Layer Deposition,” Symp on VLSI Techn Digest of Tech. Papers, pp. 65-66 (2001).
Karp et al., “A 4096-bit dynamic MOS RAM,” ISSCC Digest Technical Papers, pp. 10-11 (Feb. 1972).
Zhu et al., “Schottky s/d MOSFETs with high-K gate dielectrics and metal gate electrodes,” 0-7803-8511-X, IEEE, pp. 53-56 (2004).
Ji Brian L.
Luk Wing K.
International Business Machines - Corporation
Ryan & Mason & Lewis, LLP
Tran Michael T
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