Method of ion implanting for tri-gate devices

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C257SE27112, C257SE29275, C257SE21618, C257SE21633

Reexamination Certificate

active

07449373

ABSTRACT:
A method for ion implanting a tip source and drain region and halo region for a tri-gate field-effect transistor is described. A silicon body is implanted, in one embodiment, from six different angles to obtain ideal regions.

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