Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2005-12-08
2008-12-16
Chen, Kin-Chan (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C451S287000
Reexamination Certificate
active
07465668
ABSTRACT:
A method for manufacturing a semiconductor device is provided, which includes depositing a conductive film above an insulating film formed above a semiconductor substrate and having a recess, thereby forming a treating film, polishing the treating film while feeding a first chemical solution containing abrasive particles and a second chemical solution containing an oxidizing agent over a polishing pad, the treating film being contacted with the polishing pad at a first load, and subsequent to the polishing, subjecting a surface of the treating film to a chemical-polishing by continuing the feeding of the first chemical solution over the polishing pad while suspending the feeding of the second chemical solution, the treating film being contacted with the polishing pad at a second load which is smaller than the first load.
REFERENCES:
patent: 6059920 (2000-05-01), Nojo et al.
patent: 6139400 (2000-10-01), Sato et al.
patent: 6455432 (2002-09-01), Tsai et al.
patent: 6565422 (2003-05-01), Homma et al.
patent: 2001/0006841 (2001-07-01), Tsuchiya et al.
patent: 2002/0146965 (2002-10-01), Thomas et al.
patent: 2002/0168923 (2002-11-01), Kaufman et al.
patent: 2003/0060145 (2003-03-01), Li et al.
patent: 2004/0009671 (2004-01-01), Kaufman et al.
patent: 2005/0196954 (2005-09-01), Noguchi
patent: 3440826 (2003-06-01), None
patent: 2004-335896 (2004-11-01), None
Fukushima Dai
Minamihaba Gaku
Yano Hiroyuki
Chen Kin-Chan
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Kabushiki Kaisha Toshiba
LandOfFree
Method of manufacturing semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of manufacturing semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of manufacturing semiconductor device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4031975