Method of recording temporary defect list on write-once...

Details Method of recording temporary defect list on write-once... Method of recording temporary defect list on write-once...

2004-04-26

2008-12-09

Young, Wayne R (Department: 2627)

Dynamic information storage or retrieval

Control of storage or retrieval operation by a control...

By medium defect indicative control signal

C369S053150, C369S053170, C714S005110, C711S134000, C711S118000, C711S118000, C711S003000, C711S003000

Reexamination Certificate

active

07463562

ABSTRACT:
A method of recording a temporary defect list on a write-once recording medium, a method of reproducing the temporary defect list, an apparatus for recording and/or reproducing the temporary defect list, and the write-once recording medium. The method of recording a temporary defect list for defect management on a write-once recording medium includes recording the temporary defect list, which is created while data is recorded on the write-once recording medium, in at least one cluster of the write-once recording medium, and verifying if a defect is generated in the at least one cluster. Then, the method includes re-recording data originally recorded in a defective cluster in another cluster, and recording pointer information, which indicates a location of the at least one cluster where the temporary defect list is recorded, on the write-once recording medium.

REFERENCES:
patent: 5111444 (1992-05-01), Fukushima et al.
patent: 5235585 (1993-08-01), Bish et al.
patent: 5404357 (1995-04-01), Ito et al.
patent: 5914928 (1999-06-01), Takahashi
patent: 6223302 (2001-04-01), Nakamura et al.
patent: 6341109 (2002-01-01), Kayanuma
patent: 6367038 (2002-04-01), Ko
patent: 6385148 (2002-05-01), Ito et al.
patent: 6564345 (2003-05-01), Kim et al.
patent: 6606285 (2003-08-01), Ijtsma et al.
patent: 6978404 (2005-12-01), Ueda et al.
patent: 7002882 (2006-02-01), Takahashi
patent: 2002/0136537 (2002-09-01), Takahashi
patent: 2004/0145980 (2004-07-01), Park et al.
patent: 2006/0077827 (2006-04-01), Takahashi
patent: 1381839 (2002-11-01), None
patent: 2000-0015037 (2000-03-01), None
Office Action issued in Chinese Patent Application No. 2004800014155 on Aug. 4, 2006.
U.S. Appl. No. 11/769,163, filed Jun. 27, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,453, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,490, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,539, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,649, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,724, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,755, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,784, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,820, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,927, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/962,978, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/963,056, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.
U.S. Appl. No. 11/963,140, filed Dec. 21, 2007, Sung-hee Hwang, Samsung Electronics Co., Ltd.

Affiliated with

Also associated with

Rating

Method of recording temporary defect list on write-once... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of recording temporary defect list on write-once..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of recording temporary defect list on write-once... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4028989