Method for producing a pellicle for lithography

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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C428S014000, C156S060000

Reexamination Certificate

active

07432023

ABSTRACT:
There is provided a pellicle for lithography which has at least, a pellicle film for dustproof protection, a pellicle frame to which the pellicle film is adhered, an adhesive layer provided on one end face of the pellicle frame in order to adhere the pellicle film, and a sticking layer formed on another end face of the pellicle frame, wherein the pellicle film is formed by a die coating machine and a method for producing it. There can be provided a relatively large-sized pellicle for lithography which has a pellicle film with little unevenness of film thickness and with a uniform and high light transmission can be produced easily and at low cost, compared with those using the conventional spin coater.

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patent: 6960387 (2005-11-01), Suzuki et al.
patent: 7012746 (2006-03-01), Bermel
patent: 2001/0024701 (2001-09-01), Matsukura et al.
patent: B2 63-27707 (1983-10-01), None
patent: A 58-219023 (1983-12-01), None
patent: B2 2644457 (1997-03-01), None
patent: A 10-421 (1998-01-01), None
patent: 2001-330943 (2001-11-01), None
patent: 2001-343738 (2001-12-01), None
patent: 2002-239445 (2002-08-01), None
English language translation of Japanese Office Action.

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