Negative thermal expansion system (NTEs) device for TCE...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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C257S758000, C257SE23080, C257SE23128, C428S317900, C359S291000

Reexamination Certificate

active

07417315

ABSTRACT:
A Negative Thermal Expansion system (NTEs) device for TCE compensation or CTE compensation in elastomer composites and conductive elastomer interconnects in microelectronic packaging. One aspect of the present invention provides a method for fabricating micromachine devices that have negative thermal expansion coefficients that can be made into a composite for manipulation of the TCE of the material. These devices and composites made with these devices are in the categories of materials called “smart materials” or “responsive materials.” Another aspect of the present invention provides microdevices comprised of dual opposed bilayers of material where the two bilayers are attached to one another at the peripheral edges only, and where the bilayers themselves are at a minimum stress conditions at a reference temperature defined by the temperature at which the bilayers are formed. These devices have the technologically useful property of volumetrically expanding upon lowering of the device temperature below the reference or processing temperature.

REFERENCES:
patent: 5452878 (1995-09-01), Gravesen et al.
patent: 6513939 (2003-02-01), Fettig et al.
patent: 6768412 (2004-07-01), Becka et al.
patent: 6846087 (2005-01-01), Carr et al.
patent: 6922272 (2005-07-01), de Groot et al.
patent: 2002/0054466 (2002-05-01), Wood et al.

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