Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor
Reexamination Certificate
2005-01-24
2008-10-14
Smoot, Stephen W (Department: 2813)
Semiconductor device manufacturing: process
Formation of semiconductive active region on any substrate
Amorphous semiconductor
C438S558000, C438S562000, C257SE21148
Reexamination Certificate
active
07435668
ABSTRACT:
A solution containing impurity ions is applied onto the surface of a silicon film to form a solution layer, followed by drying into a compound layer containing the impurities. Heat treatment is performed by irradiation with an energy beam so as to diffuse the impurity atoms in the compound layer toward the silicon film into a source region and a drain region. Subsequently, the compound layer is removed.
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Kamei Takahiro
Kawana Yoshiyuki
Machida Akio
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Smoot Stephen W
Sony Corporation
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