Method and system for evaluating timing in an integrated...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C703S016000

Reexamination Certificate

active

07444608

ABSTRACT:
Methods for analyzing the timing in integrated circuits and for reducing the pessimism in timing slack calculations in static timing analysis (STA). The methods involve grouping and canceling the delay contributions of elements having similar delays in early and late circuit paths. An adjusted timing slack is calculated using the delay contributions of elements having dissimilar delays. In some embodiments, the delay contributions of elements having dissimilar delays are root sum squared. Embodiments of the invention provide methods for reducing the pessimism due to both cell-based and wire-dependent delays. The delays considered in embodiments of the invention may include delays due to the location of elements in a path.

REFERENCES:
patent: 5426591 (1995-06-01), Ginetti et al.
patent: 5508937 (1996-04-01), Abato et al.
patent: 5636372 (1997-06-01), Hathaway et al.
patent: 5654898 (1997-08-01), Roetcisoender et al.
patent: 5726902 (1998-03-01), Mahmood et al.
patent: 5764525 (1998-06-01), Mahmood et al.
patent: 5944834 (1999-08-01), Hathaway
patent: 6141632 (2000-10-01), Smith et al.
patent: 6148434 (2000-11-01), Nozuyama
patent: 6237127 (2001-05-01), Craven et al.
patent: 6240542 (2001-05-01), Kapue
patent: 6253359 (2001-06-01), Cano et al.
patent: 6442741 (2002-08-01), Schultz
patent: 6536024 (2003-03-01), Hathaway
patent: 6553550 (2003-04-01), Menegay et al.
patent: 6615395 (2003-09-01), Hathaway et al.
patent: 6658635 (2003-12-01), Tanimoto
patent: 6745376 (2004-06-01), Fredrickson
patent: 6772402 (2004-08-01), Mortensen
patent: 6789223 (2004-09-01), Fetherson
patent: 6791343 (2004-09-01), Ramarao et al.
patent: 6799308 (2004-09-01), You et al.
patent: 6807509 (2004-10-01), Bourdin et al.
patent: 6886152 (2005-04-01), Kong
patent: 6910194 (2005-06-01), Mielke et al.
patent: 6912665 (2005-06-01), Ellis et al.
patent: 6940293 (2005-09-01), Ramarao et al.
patent: 7089143 (2006-08-01), Foreman et al.
patent: 7117466 (2006-10-01), Kalafala et al.
patent: 7219320 (2007-05-01), Kawano et al.
patent: 7353477 (2008-04-01), Hathaway et al.
patent: 7356451 (2008-04-01), Moon et al.
patent: 2003/0084418 (2003-05-01), Regan
patent: 2005/0066297 (2005-03-01), Kalafala et al.
patent: 2005/0081171 (2005-04-01), Kawano et al.
Aseem Agarwal, et al., “Statistical Timing Analysis for Intra-Die Process Variations with Spatial Correlations,” ICCAD '03, Nov. 11-13, 2003 pp. 621-625.
Hongliang Chang, et al., “Statistical Timing Analysis Considering Spatial Correlations Using a Single Pert-Like Traversal,” ICCAD '03, Nov. 11-13, 2003, pp. 900-907.
Michael Orshansky, et al., “Impact of Spatial Intrachip Gate Length Variability on the Performance of High-Speed Digital Circuits,” IBEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 21, No. 5, May 2002, pp. 544-553.
Orshanksy et al., “A Generalistic Probabilistic Framework for Worst Case Timing Analysis,” DAC 2002, pp. 556-561.
Devgan et al., “Block Based Statis Timing Analysis with Uncertainty,” ICCAD 2003, pp. 607-614.
McGeer et al., “Timing Analysis and delay-Fault Test Generation Using Path-Recursive Functions,” 1991 IEEE, pp. 180-183.
Blaauw et al., “Slope Propagation in Static Timing Analysis,” Oct. 2002, IEEE Transactions on Computer-Aided Design of integrated Circuits and Systems, vol. 21, No. 10, pp. 1180-1195.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and system for evaluating timing in an integrated... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and system for evaluating timing in an integrated..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and system for evaluating timing in an integrated... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4002047

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.