Magnetic memory device

Static information storage and retrieval – Systems using particular element – Magnetoresistive

Reexamination Certificate

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C365S189011

Reexamination Certificate

active

07443718

ABSTRACT:
A magnetic memory device comprises a magnetic tunnel junction (MTJ) having a ferromagnetic free layer, and exhibits a first, relatively high resistance state, and a second, relatively low resistance state. To write to the magnetic memory device a current IMTJis driven through the MTJ. For a first duration, the current is equal to a DC threshold current, being the DC current required to switch the multilayer structure between the first state and the second state. This induces a C-like domain structure in the free layer. For a second duration, the current IMTJis larger than the DC threshold current. This causes the MTJ to switch states. The current requited to cause switching is less than that required using a uniform current pulse.

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Devolder, T. et al, “Precharging Stragegy to Accelerate Spin-Transfer Switching Below the nanosecond,” Applied Physics Letters 86, 2005 American Institute of Physics, pp. 062505-1-062505-3 (3 pages).
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Highly Scalable MRAM using Field Assisted current Induced Switching, Jeong et al. 2005 Symposium on VLSI technology Digest of Technical Papers, p. 184.

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