Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2004-06-16
2008-10-14
Walke, Amanda C. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S281100
Reexamination Certificate
active
07435527
ABSTRACT:
A positive resist composition comprising (A) a compound that generates an acid upon irradiation of an actinic ray or radiation, (B) a resin that is insoluble or hardly soluble in an alkali developing solution but becomes soluble in the alkali developing solution by the action of an acid, and (C) a compound having at least one group that is decomposed with an acid to generate a carboxylic acid and at least three groups selected from hydroxy group and substituted hydroxy group.
REFERENCES:
patent: 4491628 (1985-01-01), Ito et al.
patent: 5609982 (1997-03-01), Sato et al.
patent: 5639587 (1997-06-01), Sato et al.
patent: 5849461 (1998-12-01), Hatakeyama et al.
patent: 5939234 (1999-08-01), Yamanaka et al.
patent: 5981140 (1999-11-01), Sato et al.
patent: 6022665 (2000-02-01), Watanabe et al.
patent: 6511785 (2003-01-01), Takemura et al.
patent: 6593056 (2003-07-01), Takeda et al.
patent: 6777158 (2004-08-01), Maemori et al.
patent: 6818380 (2004-11-01), Maemori et al.
patent: 7214465 (2007-05-01), Nakao et al.
patent: 2001/0035394 (2001-11-01), Takeda et al.
patent: 2002/0045133 (2002-04-01), Maemori et al.
patent: 2002/0058202 (2002-05-01), Maemori et al.
patent: 2002/0106580 (2002-08-01), Nitta et al.
patent: 2004/0067615 (2004-04-01), Maemori et al.
patent: 2004/0166433 (2004-08-01), Dammel et al.
patent: 2004/0166434 (2004-08-01), Dammel et al.
patent: 2005/0037291 (2005-02-01), Nitta et al.
patent: 2005/0170276 (2005-08-01), Nitta et al.
patent: 2-161436 (1990-06-01), None
patent: 5-232406 (1993-09-01), None
patent: 2002091001 (2002-03-01), None
English language machine translation of JP 2002-091001.
FUJIFILM Corporation
Sughrue & Mion, PLLC
Walke Amanda C.
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