Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2003-11-10
2008-10-14
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C703S014000
Reexamination Certificate
active
07437692
ABSTRACT:
A simulation/debugging method for SOC designs that utilizes initial memory values loaded into a simulation model. A test program is then executed, and incremetal transaction records are generated for each incremental memory access (e.g., data write operations). Each transaction record includes a timestamp, address and data values. The transaction record information is stored/captured on a high level-based (i.e., system address-based) domain that takes into account all the tiling, interleaving, scrambling, and unaligned accessing used in the simulated SOC design, rather than on a low level-based (i.e., physical memory address-based) domain. Upon completing the simulation, the instantaneous memory contents at any selected point in time during the simulated execution are calculated by combining the initial data and intermediate transaction record information. Automatic memory dump and sanity check tests verify the integrity of the final data value and incremental transactions. Cache memory information is collected and displayed using a system-level format.
REFERENCES:
patent: 6658519 (2003-12-01), Broberg et al.
Dickstein & Shapiro LLP
Do Thuan
Infineon - Technologies AG
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