DRAM including segment read circuit

Static information storage and retrieval – Systems using particular element – Capacitors

Reexamination Certificate

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Details

C365S189050, C365S189150, C365S189170, C365S194000, C365S207000, C365S230030

Reexamination Certificate

active

07443714

ABSTRACT:
A time-domain sensing scheme is introduced for reading a DRAM cell and bit lines are multi-divided for reducing parasitic loading. Thereby lightly loaded bit line is quickly charged by a selected memory cell when reading data “1”. The charged voltage is amplified by a segment read circuit, which quickly changes an output of a block read circuit. In contrast, the bit line is discharged when reading data “0”, so that impedance of the segment read circuit is increased, which slowly changes the output of a block read circuit. Hence, data “1” is arrived early but data “0” is not arrived to a latch circuit, because the latch is locked by a locking signal based on data “1”. Furthermore storage capacitor is reduced to drive short bit line only. Additionally, various alternatives are described.

REFERENCES:
patent: 5357474 (1994-10-01), Matano et al.
patent: 5822260 (1998-10-01), Tamaki
patent: 6456521 (2002-09-01), Hsu et al.
patent: 6512717 (2003-01-01), Eto et al.
patent: 6930940 (2005-08-01), Haraguchi
patent: 7292496 (2007-11-01), Akiba et al.

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