Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2007-12-26
2008-10-21
Iqbal, Nadeem (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
Reexamination Certificate
active
07441156
ABSTRACT:
An apparatus for testing an operation of a semiconductor memory device having a plurality of banks in a compress test mode includes an internal address generator for receiving an external bank address and generating internal bank addresses in response to a bank interleaving test signal; a read operation testing block for receiving the internal bank addresses and testing a read operation of the semiconductor memory device in response to the bank interleaving test signal; and a write operation testing block for receiving the internal bank addresses and testing a write operation of the semiconductor memory device.
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Blakely & Sokoloff, Taylor & Zafman
Hynix / Semiconductor Inc.
Iqbal Nadeem
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