Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2004-08-30
2008-05-27
Gurley, Lynne (Department: 2811)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C438S014000, C438S017000, C438S053000, C438S107000, C438S110000, C438S011000, C438S012000, C438S460000, C438S462000, C257SE21521
Reexamination Certificate
active
07378290
ABSTRACT:
An isolation circuit includes a first pad adapted to receive a control signal and a second pad adapted to receive another signal. A third pad is coupled to a microelectronic die and a device is provided to transfer the other signal from the second pad to the third pad in response to the control signal.
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Response to Non-Final Office Action mailed Apr. 27, 2004 in U.S. Appl. No. 10/176,015, now U.S. Patent No. 7,026,646, 18 pgs.
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Cowles Timothy B.
Lunde Aron T.
Gurley Lynne
Im Junghwa
Schwegman Lundberg & Woessner, P.A.
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