High voltage semiconductor devices and methods for...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S336000, C257S342000, C257S346000, C257S401000, C257S409000, C257S492000, C257S493000, C257SE29012, C257SE29256, C257SE29261, C257SE21417, C257SE21427

Reexamination Certificate

active

07345341

ABSTRACT:
High voltage semiconductor devices and methods for fabricating the same are provided. An exemplary embodiment of a semiconductor device capable of high-voltage operation, comprising a substrate comprising a first well formed therein. A gate stack is formed overlying the substrate, comprising a gate dielectric layer and a gate electrode formed thereon. A channel well and a second well are formed in portions of the first well. A source region is formed in a portion of the channel well. A drain region is formed in a portion of the second well, wherein the gate dielectric layer comprises a relatively thinner portion at one end of the gate stack adjacent to the source region and a relatively thicker portion at one end of the gate stack adjacent to and directly contacts the drain region.

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patent: 2002/0072159 (2002-06-01), Nishibe et al.

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