Line width error check

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Details

C716S030000, C716S030000

Reexamination Certificate

active

07428714

ABSTRACT:
A method of checking for errors in line width in an integrated circuit includes identifying with a marker any lines having a line width greater than a minimum line width, and associating a line width parameter with each line width marker, the line width parameter corresponding to a line width for the marked line. The line width parameters for each line width marker are compared to the actual layout line width.

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