Focusing device, focusing method and a pattern inspecting...

Radiant energy – Photocells; circuits and apparatus – Photocell controls its own optical systems

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S201400

Reexamination Certificate

active

07394048

ABSTRACT:
A focusing device comprises a first imaging optical system, a second imaging optical system which splits the optical image in the direction of an AF sensor and further splits the optical image so that a front focus image in which the point that is in focus is in front of the optical image on the inspecting sensor and a back focus image in which the point that is in focus is behind the optical image on the inspecting sensor are formed on the AF sensor, a focus detecting circuit which detects an optimum focus position on the basis of a high-frequency component of a front sensor image in a front focus position and a high-frequency component of a back sensor image in a back focus position, and a focus control circuit which controls the focusing of the first imaging optical system on the basis of the focus position.

REFERENCES:
patent: 2007/0280664 (2007-12-01), Ikeda et al.
patent: 60-26311 (1985-02-01), None
patent: 9-49965 (1997-02-01), None
patent: 11-271597 (1999-10-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Focusing device, focusing method and a pattern inspecting... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Focusing device, focusing method and a pattern inspecting..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Focusing device, focusing method and a pattern inspecting... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3973326

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.