Methods for repairing and for operating a memory component

Static information storage and retrieval – Read/write circuit – Bad bit

Reexamination Certificate

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C365S189070, C365S230030, C365S189040

Reexamination Certificate

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11274059

ABSTRACT:
In a method for repairing a memory component, data retention times of regular memory cells are determined. Weak regular memory cells having a data retention time that is shorter than a predetermined limit value are determined. A device is programmed in such a manner that a write or read access to the weak regular memory cell is simultaneously also effected for a redundant memory cell in order to jointly read from, or write to, the weak regular memory cell and the redundant memory cell.

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patent: 0335149 (1989-10-01), None

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