Test pixel and test pixel array for evaluating pixel quality...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257SE23179

Reexamination Certificate

active

10745749

ABSTRACT:
A test pixel for use in a CMOS image sensor is employed to evaluate a pixel quality by modulating a contact chain. The test pixel for use the CMOS image sensor including: a test pixel active area corresponding to each unit pixel active area, wherein the unit pixel active area has a floating diffusion contact, a VDD contact and an output contact therein; an active area contact having a first, a second and a third contacts disposed at predetermined locations of each test pixel active area, wherein the first, the second and the third contacts are correspondent to the floating diffusion contact, the VDD contact and the output contact in the unit pixel, respectively; a contact chain in order for a test current to flow vertically or a horizontally through the active area contact; a test pad having a first test pad and a second test pad; and a test gate of which a predetermined portion is overlapped over the test pixel active area, for applying a predetermined signal thereto.

REFERENCES:
patent: 6992327 (2006-01-01), Tone et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Test pixel and test pixel array for evaluating pixel quality... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test pixel and test pixel array for evaluating pixel quality..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test pixel and test pixel array for evaluating pixel quality... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3948717

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.