Semiconductor memory device with increased node capacitance

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Reexamination Certificate

active

10596029

ABSTRACT:
An integrated circuit semiconductor memory device having the BOX layer removed from under the gate of a storage transistor to increase the gate-to-substrate capacitance and reduce the soft error rate. The increased node capacitance thus obtained is achieved without requiring a corresponding increase in area.

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