Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Reexamination Certificate
2008-09-02
2008-09-02
Le, Vu A (Department: 2824)
Static information storage and retrieval
Read/write circuit
Including reference or bias voltage generator
C365S229000
Reexamination Certificate
active
11546955
ABSTRACT:
The present invention provides a semiconductor integrated circuit device which includes at least an SRAM memory cell array comprising a plurality of memory cells each constituted of a circuit including load MOS transistors, drive MOS transistors and transfer MOS transistors, a substrate bias generating circuit which is electrically connected to the load MOS transistors and supplies a substrate potential to the load MOS transistors during at least operation and standby, and a source bias generating circuit which is electrically connected to the drive MOS transistors and supplies a source potential to the drive MOS transistors at standby. It is possible to reduce a leak current in an SRAM memory cell during both operation and standby and reduce current consumption.
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Hirota Makoto
Kikuchi Hidekazu
Le Vu A
Oki Electric Industry Co. Ltd.
Studebaker Donald R.
Studebaker & Brackett PC
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