Top anti-reflective coating composition and method for...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S311000, C430S270100

Reexamination Certificate

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11177738

ABSTRACT:
Disclosed herein is a top anti-reflective coating composition which comprises a photoacid generator represented by Formula 1 below.wherein n is between 7 and 25.Since the top anti-reflective coating composition dissolves a portion of a photoacid generator present at the top of an underlying photosensitizer, particularly, upon formation of a top anti-reflective coating, it can prevent the top from being formed into a thick section. Therefore, the use of the anti-reflective coating composition enables the formation of a vertical pattern on a semiconductor device.

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Hagiwara et al “Characterization of TFE
orbornene-based fluoropolymer resist for 157-nm lithography”, Advances in Resist Technology and Processing XXI, Proceedings of SPIE, Vo. 5376 (SPIE, Bellingham, WA, May 2004) pp. 159-168.
Research Disclosure, No. 33701, “Highly Soluble, Thermally Stable Photoacid Initiators”, anonymously submitted, May 1992, two pages.

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