Multilayer interconnection board and production method thereof

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S618000, C438S660000, C438S665000, C438S652000, C438S689000, C438S624000, C257S758000, C257S760000, C257S295000, C257SE21575, C257SE21585

Reexamination Certificate

active

11026971

ABSTRACT:
A multilayer interconnection board is disclosed that allows reliable electrical connection between an interconnection having a large width and a large area and a via provided in a via hole formed by pressing a tool against resin. A projecting portion for electrical connection is formed integrally with the insulating member and in a second interconnection groove having a width and an area greater than those of a first interconnection groove. While a first interconnection is being deposited in the first interconnection groove and a second interconnection is being deposited in the second interconnection groove, the projecting portion is formed in the second interconnection groove and a metal plating film is provided on the projecting portion at the same time, so as to electrically connect the second interconnection with the via.

REFERENCES:
patent: 6783652 (2004-08-01), Iijima et al.
patent: 2004/0056289 (2004-03-01), Ooishi
patent: 2004/0188843 (2004-09-01), Wakayama et al.

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