Semiconductor device and method of manufacture thereof

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

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Details

C438S585000, C438S942000, C438S947000, C216S041000, C257SE21240, C257SE21241, C257SE21432, C257SE21487, C257SE21158

Reexamination Certificate

active

11790033

ABSTRACT:
A method of manufacturing a MOS transistor incorporating a silicon oxide film serving as a gate insulating film and containing nitrogen and a polycrystalline silicon film serving as a gate electrode and containing a dopant and arranged such that the gate electrode is formed on the gate electrode insulating film, and an oxidation process using ozone is performed to sufficiently round the shape of the lower edge of the gate electrode.

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