Dynamic magnetic information storage or retrieval – Monitoring or testing the progress of recording
Reexamination Certificate
2007-08-07
2007-08-07
Wellington, Andrea (Department: 2627)
Dynamic magnetic information storage or retrieval
Monitoring or testing the progress of recording
C360S046000, C360S051000, C360S055000, C360S066000, C360S068000
Reexamination Certificate
active
11176414
ABSTRACT:
The invention includes a testing method which may be applied to at least one writer in a disk drive during the self-test phase to generate write parameters, focused on the Over Shoot Control (OSC) of the write current parameter to improve the reliability of write operations by that writer. The Minimum OSC is used for write operations in normal temperatures. The Optimum OSC is used for a first lower temperature range, preferably between essentially 15 degrees Centigrade and essentially 5 degrees Centigrade. The Maximum OSC is preferred below essentially 5 degrees Centigrade. The Minimum OSC should preferably guarantee both an Adjacent Track Write (ATW) criteria, as well as guarantee a Write Induced Instability (WII) criteria. The invention includes the write parameter collection, as well as the disk drive containing the generated write parameter collection. The invention also includes the method of using that write parameter collection to control a writer while writing to tracks belonging to the radial zone collection and program systems implementing the invention's methods.
REFERENCES:
patent: 5121260 (1992-06-01), Asakawa et al.
patent: 5600500 (1997-02-01), Madsen et al.
patent: 6069758 (2000-05-01), Chung
patent: 6118614 (2000-09-01), Lee
patent: 6297921 (2001-10-01), Price, Jr. et al.
patent: 6445521 (2002-09-01), Schaff et al.
patent: 6549353 (2003-04-01), Teterud
patent: 6643081 (2003-11-01), Walker et al.
patent: 6696832 (2004-02-01), Chew et al.
patent: 6788489 (2004-09-01), Chang et al.
patent: 6954322 (2005-10-01), Yun et al.
patent: 6957379 (2005-10-01), Patapoutian et al.
patent: 6958875 (2005-10-01), Yun et al.
patent: 6975475 (2005-12-01), Lee et al.
patent: 2004/0169947 (2004-09-01), Yun et al.
patent: 2004/0169953 (2004-09-01), Yun et al.
patent: 2005/0057835 (2005-03-01), Kim et al.
patent: 2005/0146803 (2005-07-01), Kim et al.
Cho Keung Youn
Lee Hae Jung
Lee Sang
GSS Law Group
Jennings Earle
Mercedes Dismery
Samsung Electronics Co,. Ltd.
Wellington Andrea
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