Method and apparatus for testing tunnel magnetoresistive...

Details Method and apparatus for testing tunnel magnetoresistive... Method and apparatus for testing tunnel magnetoresistive...

2007-06-26

2007-06-26

Elms, Richard T. (Department: 2824)

Static information storage and retrieval

Systems using particular element

Magnetoresistive

C365S201000, C360S324200

Reexamination Certificate

active

11101468

ABSTRACT:
Testing a TMR element includes a step of measuring initially a resistance value of the TMR element to provide the measured resistance value as a first resistance value, a step of measuring a resistance value of the TMR element after continuously feeding a current through the TMR element from a anti-substrate side to a substrate side for a predetermined period of time, to provide the measured resistance value as a second resistance value, and a step of evaluating the TMR element by comparing the first resistance value and the second resistance value with each other.

REFERENCES:
patent: 6359433 (2002-03-01), Gillis et al.
patent: 6473257 (2002-10-01), Shimazawa et al.
patent: 6657829 (2003-12-01), Nakazawa et al.
patent: 6820020 (2004-11-01), Yokoyama et al.
patent: 2000-260012 (2000-09-01), None
Bae et al. Dec. 15, 2003. Electrical Reliability of Tunnelling Magnetoresistive Heads. Journal of Applied Physics. vol. 94 No. 12.
U.S. Appl. No. 11/070,237, by Shunji et al., filed Mar. 3, 2005.

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