Titanium underlayer for lines in semiconductor devices

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S687000, C257S770000, C257SE21204

Reexamination Certificate

active

10510641

ABSTRACT:
A thin Titanium underlayer22is included beneath a Titanium rich Titanium Nitride layer28in a metal line20on a silicon substrate to reduce stress voiding.

REFERENCES:
patent: 5960320 (1999-09-01), Park
patent: 6140224 (2000-10-01), Lin
patent: 6346480 (2002-02-01), Yamamoto et al.
patent: 6443743 (2002-09-01), Saran
patent: WO 97/06562 (1997-02-01), None

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