Nitrogen-containing organic compound, resist composition and...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S325000, C430S326000, C430S926000, C548S304400, C546S273400

Reexamination Certificate

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10974759

ABSTRACT:
Resist compositions comprising nitrogen-containing organic compounds having a benzimidazole structure and a specific ether chain moiety have an excellent resolution, form precisely configured patterns with minimized roughness of sidewalls and are useful in microfabrication using electron beams or deep-UV light.

REFERENCES:
patent: 4491628 (1985-01-01), Ito et al.
patent: 5310619 (1994-05-01), Crivello et al.
patent: 5436262 (1995-07-01), Mantovanini et al.
patent: 6004724 (1999-12-01), Yamato et al.
patent: 6261738 (2001-07-01), Asakura et al.
patent: 6352985 (2002-03-01), Yamasaki et al.
patent: 6908722 (2005-06-01), Ebata et al.
patent: 7022459 (2006-04-01), Kodama
patent: 63-27829 (1988-02-01), None
patent: 2-27660 (1990-06-01), None
patent: 5-158239 (1993-06-01), None
patent: 5-232706 (1993-09-01), None
patent: 5-249662 (1993-09-01), None
patent: 5-249683 (1993-09-01), None
patent: 5-257282 (1993-10-01), None
patent: 5-289322 (1993-11-01), None
patent: 5-289340 (1993-11-01), None
patent: 6-194834 (1994-07-01), None
patent: 6-242605 (1994-09-01), None
patent: 6-242606 (1994-09-01), None
patent: 6-263716 (1994-09-01), None
patent: 6-266100 (1994-09-01), None
patent: 6-266111 (1994-09-01), None
patent: 7-92678 (1995-04-01), None
patent: 7-92680 (1995-04-01), None
patent: 7-92681 (1995-04-01), None
patent: 07-120929 (1995-05-01), None
patent: 7-128859 (1995-05-01), None
patent: 7-134419 (1995-05-01), None
patent: 9-95479 (1997-04-01), None
patent: 9-208554 (1997-08-01), None
patent: 9-230588 (1997-09-01), None
patent: 2000-314956 (2000-11-01), None
patent: 6-263717 (2004-09-01), None
patent: WO 9210491 (1992-06-01), None
Brain, C.T. et al., Tetrahedron Letters 43(10) 2002 1893-1895.
Chemical Abstract DN 135:164628, Kucukbay, H. et al. Arzneimittel-Forschung, 2001, 51(5), 420-424.
Ozdemir, I. et al., Eur.J.Inorg.Chem. 2004, 418-422.
Hinsberg et al., “Fundamental studies of airborne chemical contamination of chemically amplified resists”, Journal of Photopolymer Science and Technology, vol. 6, No. 4 (1993), pp. 535-546.
Kumada et al., “Study on over-top coating of positive chemical amplification resists for KrF excimer laser lithography”, Journal of Photopolymer Science and Technology, vol. 6, No. 4 (1993), pp. 571-574.
Hatakeyama et al., “Investigation of discrimination enhancement with new modeling for polyhydroxystyrene positive resists”, Journal of Photopolymer Science and Technology, vol. 13, No. 4 (2000), pp. 519-524.
Airimitsu et al., “Sensitivity enhancement of chemical- amplification-type photoimaging materials by acetoacetic acid derivatives”, Journal of Photopolymer Science and Technology, vol. 8, No. 1 (1995), pp. 43-44, 45-46.
Airimutsu et al., “Effect of phenolic hydroxyl residues on the improvement of acid-proliferation-type photoimaging materials”, Journal of Photopolymer Science and Technology, vol. 9, No. 1 (1996), pp. 29-30.

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