Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-08-28
2007-08-28
Baumeister, B. William (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE29272
Reexamination Certificate
active
11108933
ABSTRACT:
A MFS type field effect transistor includes a semiconductor layer, a PZT system ferroelectric layer formed on the semiconductor layer, a gate electrode formed on the PZT system ferroelectric layer, and an impurity layer composing a source or a drain, formed in the semiconductor layer. The PZT system ferroelectric layer includes Nb that replaces a Ti composition by 2.5 mol % or more but 40 mol % or less.
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patent: 6825517 (2004-11-01), Dimmler et al.
patent: 6908802 (2005-06-01), Ramesh
patent: 2003/0227803 (2003-12-01), Natori et al.
patent: 2001-0037449 (2001-05-01), None
patent: 2003-0036405 (2003-05-01), None
Communication from Korean Patent Office regarding counterpart application.
Hamada Yasuaki
Kijima Takeshi
Baumeister B. William
Farahani Dana
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