Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-10-30
2007-10-30
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
11122221
ABSTRACT:
In transistor layout design, a plurality of distances Lfig1, Lfig2, Lfig3from a gate electrode of a transistor to the edge of a diffusion layer are displayed by multiple lines according to a variation amount of a transistor characteristic with the use of a CAD tool. A layer for defining an isolation region between adjacent transistors is extended automatically by the CAD tool. Accordingly, even in the case where the transistor characteristic varies depending on the distance from the gate electrode of the transistor to the edge of the diffusion layer, the isolation region between the adjacent transistors can be layouted and designed optimally with no measurement of the distance by designer's visual observation necessitated.
REFERENCES:
patent: 6362506 (2002-03-01), Miyai
patent: 7032194 (2006-04-01), Hsueh et al.
patent: 7155689 (2006-12-01), Pierrat et al.
patent: 2001-351985 (2001-12-01), None
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