Method and apparatus for forming conformal SiN x films

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S775000, C257SE21293

Reexamination Certificate

active

10621712

ABSTRACT:
A silicon nitride film formation method includes: Heating a substrate to be subjected to film formation to a substrate temperature; heating a wire to a wire temperature; supplying silane, ammonia, and hydrogen gases to the heating member; and forming a silicon nitride film on the substrate.

REFERENCES:
patent: 5112466 (1992-05-01), Ohta et al.
patent: 6124186 (2000-09-01), Molenbroek
patent: 6214706 (2001-04-01), Madan et al.
patent: 6355582 (2002-03-01), Hosoda et al.
patent: 6806149 (2004-10-01), Bu et al.
patent: 2002/0123245 (2002-09-01), Tsujita et al.
patent: 2002/0137363 (2002-09-01), Thakur
patent: 2002/0142624 (2002-10-01), Levy et al.
patent: 2002/0189545 (2002-12-01), Matsumura et al.
Osono et al, Coverage Properties of Silicon Nitride Film Prepared by the Cat-CVD Method, Thin Films, Apr. 2003, Apr. 2003.
Osono, S. et al., Elsevier Thin Solid Films 430 (2003) 165-169.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for forming conformal SiN x films does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for forming conformal SiN x films, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for forming conformal SiN x films will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3849423

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.