Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-02-13
2007-02-13
Tran, Long (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S328000, C257S339000, C257S342000
Reexamination Certificate
active
11057140
ABSTRACT:
In one embodiment, a semiconductor device is formed in a body of semiconductor material. The semiconductor device includes a charge compensating trench formed in proximity to active portions of the device. The charge compensating trench includes a trench filled with various layers of semiconductor material including opposite conductivity type layers.
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Data Sheet, Semiconductor Components Industries, LLC, NUF6106FCT1, 6 Channel EMI.
“A Novel Trench Concept for the Fabrication of Compensation Devices,” M. Rub, D. Ahlers, J. Baumgartl, G. Deboy, W. Friza, O. Haberlen andl. Steinigke, pp. 203-206., ISPSD 2003, Apr. 14th-17, Cambridge, UK.
Grivna Gordon M.
Loechelt Gary H.
Zdebel Peter J.
Jackson Kevin B.
Semiconductor Components Industries LLC
Tran Long
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