Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-08-14
2007-08-14
Fourson, George (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE27067, C438S214000
Reexamination Certificate
active
11219783
ABSTRACT:
The present invention is to provide a high-quality semiconductor device allowing independent control of threshold voltage values of gate electrodes of transistors which reside in a plurality of one-conductivity-type regions and in a reverse-conductivity-type region. The semiconductor comprises a P-type Si substrate109, a plurality of P-type wells103a,103bconnected to each other via the bottom surface side of the P-type Si substrate109, and an N-type well101provided so as to surround side portions of the plurality of P-type wells103a,103b. The semiconductor device also has NMOS transistors107a,107bprovided on the P-type wells103a,103b, and PMOS transistors105a,105b,105cprovided on the N-type well101. The semiconductor device still also has an N-type well133provided just under the N-type well101and connected therewith.
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Fourson George
NEC Electronics Corporation
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