Monomer having fluorine-containing acetal or ketal...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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Details

C430S326000, C430S330000, C430S907000, C430S910000, C568S591000, C568S592000, C568S594000, C568S596000, C568S599000, C568S604000, C526S247000, C526S280000, C526S281000, C526S332000

Reexamination Certificate

active

10505799

ABSTRACT:
As a polymer exhibiting improved transparency which is suitable for a resist resin used in a chemical-amplification-type resist being applicable for photolithography using exposure light at 180 nm or shorter, this invention provides a polymer comprising a repeating unit resulting from polymerization of a monomer exhibiting a polymerization activity, wherein the monomer has a fluorine-containing acetal or ketal structure represented by general formula (1):whereinR represents an atomic group containing a carbon-carbon double bond exhibiting polymerization activity; at least one of R1and R2is fluorinated alkyl group or fluorinated aryl group having 1 to 20 carbon atoms; and R3represents a radical selected from the group consisting of hydrogen atom, alkyl group, alkoxy-substituted alkyl group, fluorinated alkyl group, aryl group, fluorinated aryl group, aralkyl group and fluorinated aralkyl group having 1 to 20 carbon atoms.

REFERENCES:
patent: 6830870 (2004-12-01), Malik et al.
patent: 2003/0059710 (2003-03-01), Inoue
patent: 2.178.724 (1972-04-01), None
patent: 50-143888 (1975-11-01), None
patent: 2002-201219 (2002-07-01), None
Hrabak et al (“Preparation and Properties of 1-Ethoxy-2,2,2-Trifluoroethyl Esters of Acrylic and Methacrylic Acids and of Their Polymers”, Journal of Polymer Science: Part A: Polymer Chemistry, vol. 26, p. 267-274 (1988).

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