Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making
Reexamination Certificate
2007-06-19
2007-06-19
Lee, Sin (Department: 1752)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Radiation sensitive composition or product or process of making
C430S326000, C430S330000, C430S907000, C430S910000, C568S591000, C568S592000, C568S594000, C568S596000, C568S599000, C568S604000, C526S247000, C526S280000, C526S281000, C526S332000
Reexamination Certificate
active
10505799
ABSTRACT:
As a polymer exhibiting improved transparency which is suitable for a resist resin used in a chemical-amplification-type resist being applicable for photolithography using exposure light at 180 nm or shorter, this invention provides a polymer comprising a repeating unit resulting from polymerization of a monomer exhibiting a polymerization activity, wherein the monomer has a fluorine-containing acetal or ketal structure represented by general formula (1):whereinR represents an atomic group containing a carbon-carbon double bond exhibiting polymerization activity; at least one of R1and R2is fluorinated alkyl group or fluorinated aryl group having 1 to 20 carbon atoms; and R3represents a radical selected from the group consisting of hydrogen atom, alkyl group, alkoxy-substituted alkyl group, fluorinated alkyl group, aryl group, fluorinated aryl group, aralkyl group and fluorinated aralkyl group having 1 to 20 carbon atoms.
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patent: 2003/0059710 (2003-03-01), Inoue
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Hrabak et al (“Preparation and Properties of 1-Ethoxy-2,2,2-Trifluoroethyl Esters of Acrylic and Methacrylic Acids and of Their Polymers”, Journal of Polymer Science: Part A: Polymer Chemistry, vol. 26, p. 267-274 (1988).
Maeda Katsumi
Nakano Kaichiro
Hayes & Soloway P.C.
Lee Sin
NEC Corporation
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