Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-05-08
2007-05-08
Fourson, George R. (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S304000, C257SE27092, C257SE29346, C257SE21396, C257SE21664, C438S243000, C438S386000
Reexamination Certificate
active
10959223
ABSTRACT:
A semiconductor device including a ferroelectric random access memory, which has a structure suitable for miniaturization and easy to manufacture, and having less restrictions on materials to be used, comprises a field effect transistor formed on a surface area of a semiconductor wafer, a trench ferroelectric capacitor formed in the semiconductor wafer in one source/drain of the field effect transistor, wherein one electrode thereof is connected to the source/drain, and a wiring formed in the semiconductor wafer and connected to the other electrode of the trench ferroelectric capacitor.
REFERENCES:
patent: 5903492 (1999-05-01), Takashima
patent: 6015990 (2000-01-01), Hieda et al.
patent: 6521938 (2003-02-01), Hamamoto
patent: 10-303396 (1998-11-01), None
Kumura Yoshinori
Kunishima Iwao
Ozaki Tohru
Fourson George R.
Kabushiki Kaisha Toshiba
Maldonado Julio J.
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
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