Static information storage and retrieval – Read/write circuit
Reexamination Certificate
2007-02-13
2007-02-13
Le, Thong Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
C365S163000, C365S196000
Reexamination Certificate
active
10664104
ABSTRACT:
An accumulated data-dependent post-manufacture shift in a characteristic of one or more of a pair of matched devices within an integrated circuit may cause a mismatch in the characteristic between the pair of matched devices. This mismatch may be reduced by preconditioning the matched devices to cause an initial shift in the characteristic in each of the matched devices and to thereby reduce an expected magnitude of any further lifetime shift in the characteristic of either matched device. In an exemplary sense amplifier circuit having matched cross-coupled PMOS load devices, a data dependent threshold mismatch between the PMOS devices resulting from a Negative Bias Temperature Instability (NBTI) effect may be reduced by biasing both of the matched PMOS devices so that both experience an initial NBTI Vt shift, and so that any expected further Vt shift in either device over the product lifetime is reduced. Consequently the amount of threshold mismatch that may subsequently develop over the product lifetime is likewise reduced.
REFERENCES:
patent: 3838295 (1974-09-01), Lindell
patent: 5248946 (1993-09-01), Murakami et al.
patent: 5414663 (1995-05-01), Komarek et al.
patent: 5515310 (1996-05-01), Winters
patent: 5525919 (1996-06-01), Phelan
patent: 5539700 (1996-07-01), Kawahara et al.
patent: 5627457 (1997-05-01), Ishiyama et al.
patent: 5638333 (1997-06-01), Lee
patent: 5650979 (1997-07-01), Komarek et al.
patent: 5696726 (1997-12-01), Tsukikawa
patent: 5710737 (1998-01-01), Komiya et al.
patent: 5731716 (1998-03-01), Pascucci
patent: 5764178 (1998-06-01), Kim
patent: 5796993 (1998-08-01), Maguire
patent: 5894233 (1999-04-01), Yoon
patent: 5982693 (1999-11-01), Nguyen
patent: 6005824 (1999-12-01), Crafts
patent: 6038181 (2000-03-01), Braceras et al.
patent: 6038195 (2000-03-01), Farmwald et al.
patent: 6041419 (2000-03-01), Huang et al.
patent: 6072733 (2000-06-01), Advani
patent: 6101141 (2000-08-01), Schöniger et al.
patent: 6111796 (2000-08-01), Chang et al.
patent: 6154064 (2000-11-01), Proebsting
patent: 6185712 (2001-02-01), Kirihata et al.
patent: 6285611 (2001-09-01), Kang
patent: 6288950 (2001-09-01), Koike
patent: 6329857 (2001-12-01), Fletcher
patent: 6359816 (2002-03-01), Nurser
patent: 6442644 (2002-08-01), Gustavson et al.
patent: 6462998 (2002-10-01), Proebsting
patent: 6470467 (2002-10-01), Tomishima et al.
patent: 6480037 (2002-11-01), Song et al.
patent: 6531931 (2003-03-01), Benyamin et al.
patent: 6574160 (2003-06-01), Eleyan et al.
patent: 6642746 (2003-11-01), Donnelly et al.
patent: 6643164 (2003-11-01), Laurent
patent: 6650580 (2003-11-01), Braceras
patent: 6717877 (2004-04-01), Suzuki et al.
patent: 6756841 (2004-06-01), Jaussi et al.
patent: 6762961 (2004-07-01), Eleyan et al.
patent: 6967506 (2005-11-01), Roger
patent: 2003/0198112 (2003-10-01), Eleyan et al.
patent: 2 792 760 (2000-10-01), None
Dorsey & Whitney LLP
Le Thong Q.
Sun Microsystems Inc.
LandOfFree
Negative bias temperature instability (NBTI) preconditioning... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Negative bias temperature instability (NBTI) preconditioning..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Negative bias temperature instability (NBTI) preconditioning... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3823290