Stable source-coupled sense amplifier

Static information storage and retrieval – Read/write circuit – Differential sensing

Reexamination Certificate

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Details

C365S205000, C365S190000, C365S196000, C365S203000, C365S208000, C327S051000, C327S052000, C327S055000, C327S057000

Reexamination Certificate

active

11191709

ABSTRACT:
An amplifier circuit includes an amplifier section (700), an equalization section (770), and an activation section (720). The P-channel transistors (702, 704) of the amplifier section are coupled to a supply terminal (802). The N-channel transistors (706, 708) of the amplifier section are coupled between the P-channel transistors and the first and second input terminals (760, 762), respectively. In the activation section, first and second pull down transistors (722, 724) are coupled between the first and second input terminals, respectively, and a second power supply terminal (726), and third pull down transistor between the first and second input terminals. The control gates of the first, second and third pull down transistors are coupled to each other. In operation, a voltage signal applied to the first and second input terminals is amplified by the N-channel transistors. A control signal is then applied to couple the first and second input terminals to a supply voltage.

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Travis N. Blalock et al., “A High-Speed Sensing Scheme for 1T Dynamic RAM's Utilizing the Clamped Bit-Line Sense Amplifier,”IEEE Journal of Solid-State Circuits, vol. 27, No. 4, Apr. 1992, pp. 618-625.
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Aiyappan Natarajan et al., “A Study of Sense Amplifiers for Advanced Microprocessor Caches in 70nm Technology,” Intel Circuit Research Labs (CRL), Hillsboro, OR.

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