Method and system for false path analysis

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

10836700

ABSTRACT:
Disclosed are methods and systems for performing false path analysis. In one approach, the methods and systems identify a set of zero or more false paths based upon both implementation-specific design data and non-implementation-specific design data. In some approaches, disclosed are methods and systems for performing automated gate-level static timing false path analysis, identification, constraint generation, and/or verification using architectural information. Static timing paths at the gate-level can be linked to the architectural information via mapping techniques found in equivalence checking (EC). The gate level static timing paths can be analyzed in the context of the architectural information to identify false paths.

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