Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-01-30
2007-01-30
Dang, Phuc T. (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S257000
Reexamination Certificate
active
11001936
ABSTRACT:
An improved memory cell having a pair of non-volatile memory transistors with each transistor using a nanocrystal gate structure, the transistor pair constructed between a pair of bit line polysilicon depositions. Between the pair of non-volatile memory transistors, a word line device is interposed, allowing serial linkage of the pair of non-volatile memory transistors.
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Atmel Corporation
Dang Phuc T.
Schneck Thomas
Schneck & Schneck
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