Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate
2007-05-29
2007-05-29
Decady, Albert (Department: 2133)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital data error correction
C714S710000
Reexamination Certificate
active
10617040
ABSTRACT:
A semiconductor synchronous dynamic random access memory (SDRAM) device capable of correcting bits having a low error rate in a Pause Refresh Tail distribution and of reducing a data holding current by lengthening a refresh period so that the refresh period exceeds a period for a Pause Refresh real power. The semiconductor memory device is made up of a 16-bit SDRAM having a Hamming Code and including an ECC (Error Correcting Code) circuit made up of an encoding circuit controlled by a first test signal to output a parity bit corresponding to an information bit, a decoding circuit controlled by second test signal to output an error location detecting signal indicating an error bit in codeword, and an error correcting circuit controlled by a third test signal to input an error location detecting signal and to output an error bit in a reverse manner.
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Ito Yutaka
Nakai Kiyoshi
Chaudry Mujtaba K.
De'cady Albert
Elpida Memory Inc.
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